Business Areas

Connected Insight delivers integrated vision technology
optimized for diverse industries.

Solar

Solar Cell Surface AOI Inspection

Performs stain, print pattern, foreign material, crack, and color inspection simultaneously on a high-speed line capable of processing 4,500 sheets per hour. AI inspection technology maximizes detection of micro defects.

Solar Cell surface AOI inspection equipment
[Solar Cell appearance AOI equipment]
Solar Cell surface AOI inspection software screen
[AOI inspection UI and analysis screen]
  • Round Cell, surface inspection,
    and various substrate
    types supported

  • Multi-inspection capability
    using Multi lighting
    in Area optics

  • Deep learning (AI) enables
    recipe-free defect detection
    and optimized classification

  • DB management system
    built with deep learning
    (AI) technology

  • High-speed review system
    measures 1,000+ defect
    points in review

  • Smart review measures
    only critical defects
    from 1,000+ point
    defect reviews

Solar Cell Wafer Internal Crack Inspection

Wafer internal crack inspection uses infrared (IR) wavelength lighting for non-destructive internal defect detection without product damage. AI inspection precisely distinguishes and detects various crack types, greatly improving detection accuracy.

Solar Cell Wafer internal crack inspection equipment
[Wafer internal crack inspection equipment]
Solar Cell Wafer internal crack inspection software screen
[Solar Cell Wafer crack inspection UI]